產品內容
Easy to change modules
Unbelievable low pric
- Atomic Force Microscope MS-818 AFM:
- Innovative: A novel optical astigmatism technique
- Available: Unbelievable low price in the market and you could choose any different function modules you need.
- Convenient: Easy to use and easy probe-changing
- Flexible: LabVIEW software makes easy expansion
- Modularization: Easy to change modules to get different signals you want.
- Passive isolation is integrated.
Main Functions | |
operation mode |
DC mode, AC mode |
static force-distance |
Yes |
dynamic force-distance |
Yes |
phase imaging |
Yes |
automatic probe approach |
Yes |
probe orientation adjustment |
Yes |
external eletric connection to tip / sample |
Yes |
Scanner (X/Y/Z) |
|
scanning range |
20µm / 20µm / 2µm |
drive resolution |
0.3nm / 0.3nm /0.03nm |
Z spatial resolution |
0.2nm |
Sample |
|
size | diameter 10 mm × thickness 5 mm |
maximum weight | 50g |
XY sample positioning | 10 × 10 mm, motoized |
AFM Software Function |
|
operation system |
Windows XP / Vista |
development platform | LabVIEW |
communication interface |
USB 2.0 (1.0, 1.1 compatible) |
raw data export |
Yes (txt file) |
scan image export |
Yes (bmp file) |
scanning mode |
line / frame |
scan angle |
0~360 degree |
real time flatten |
line flatten / frame flatten |
Image Analysis Functions | |
line profile measurement |
Yes |
contrast and bright adjustment |
Yes |
multiple color palettes |
Yes |
3D image |
Yes |
height measurement |
Yes |
roughness measurement |
Yes |
Electronics |
|
stimultaneous image |
3 channels |
AD resolution |
16 bit |
AD sampling rate |
100 kHz |
power rating |
100~240V / 50~60Hz / 180W |
公司資訊
- 統一編號28927136
- 聯絡人李嘉宜
- 更多原力精密儀器股份有限公司資訊
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